XRD-Benchtop System Aeris
In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.
PANalyticals brand-new X-ray benchtop diffractometer Aeris is an easy-to-operate and user-friendly benchtop X-ray diffractometer that impresses with data quality and speed of data acquisition so far only seen on full-power systems. With its intuitive operation, Aeris makes X-ray diffraction so simple that it is accessible for everyone. The unique touch screen user interface lets you proceed effortlessly through the measurement process of your samples. Your results are always just a few taps away:
1. Place your sample
2. Select measurement program
3. View results