The NEW XRF Benchtop System Epsilon 4
The new Epsilon 4 X-ray Fluorescence (XRF) benchtop delivers fast elemental analysis and low detection limits to enable faster process control and product quality decisions. The latest advances in excitation and detection technology have further improved the analytical capabilities of Malvern Panalytical energy dispersive XRF benchtop systems. Epsilon 4 demonstrates outstanding performance across the periodic table from C to Am with a low cost of ownership, opening the possibilities to tackle new and challenging applications traditionally performed by ICP and AAS. Sample preparation is minimal for your powder, solid, and liquid samples, and analysis is non-destructive. Epsilon 4 is ideal for elemental screening of unknown samples.
XRD Benchtop System Aeris
In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.
Malvern Panalyticals X-ray benchtop diffractometer Aeris is an easy-to-operate and user-friendly benchtop X-ray diffractometer that impresses with data quality and speed of data acquisition so far only seen on full-power systems. With its intuitive operation, Aeris makes X-ray diffraction so simple that it is accessible for everyone. The unique touch screen user interface lets you proceed effortlessly through the measurement process of your samples. Your results are always just a few taps away:
1. Place your sample
2. Select measurement program
3. View results
Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions. Meet Aeris!