26 - 28 September 2017 // Nuremberg, Germany

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Exhibitors & Products POWTECH 2017
Zoom product LOGO_Phase/Structure Analysis – XRD – Aeris

Phase/Structure Analysis – XRD – Aeris

LOGO_Phase/Structure Analysis – XRD – Aeris

Phase/Structure Analysis – XRD – Aeris

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XRD-Benchtop System Aeris

In materials research, the scientist has many analytical questions related to the crystalline constitution of material samples. X-ray diffraction is the only laboratory technique that reveals structural information, such as chemical composition, crystal structure, crystallite size, strain, preferred orientation and layer thickness. Materials researchers therefore use X-ray diffraction to analyze a wide range of materials, from powders and thin films to nanomaterials and solid objects.

PANalyticals brand-new X-ray benchtop diffractometer Aeris is an easy-to-operate and user-friendly benchtop X-ray diffractometer that impresses with data quality and speed of data acquisition so far only seen on full-power systems. With its intuitive operation, Aeris makes X-ray diffraction so simple that it is accessible for everyone. The unique touch screen user interface lets you proceed effortlessly through the measurement process of your samples. Your results are always just a few taps away:
1. Place your sample
2. Select measurement program
3. View results

Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the CementMineralsMetals and Research editions. Meet Aeris!

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Particle size analyzer – laser diffraction – Mastersizer 3000 & Insitec

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Nanoparticle size, concentration & zetapotential – DLS, ELS & NTA – Zetasizer & NanoSight

LOGO_Nanoparticle size, concentration & zetapotential – DLS, ELS & NTA – Zetasizer & NanoSight

Phase/Structure Analysis – XRD – Aeris is assigned to following product groups:

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