26 - 28 September 2017 // Nuremberg, Germany

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Zoom product LOGO_Phenom Desktop Electron Microscopes

Phenom Desktop Electron Microscopes

LOGO_Phenom Desktop Electron Microscopes

Phenom Desktop Electron Microscopes

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Phenom: Desktop Scanning Electron Microscopes (SEM) in compact All-in-One design

  • Intuitive concept of operation
  • Back-scattered electron (BSE) or secondary electron (SE) imaging detector; depending on model
  • EDX analysis; depending on model
  • High-end CeB6 cathode with high life time and high brightness for high-resolution images at low acceleration voltages
  • Ultra fast sample loading in 60 seconds
  • Integrated navigation camera for "never-lost-navigation"
  • Acceleration voltage selection between 4.8 - 20 kV; depending on model
  • Software for fully automated analysis of particles, fibers, pores and roughness data
  • Low maintenance costs
  • Charge-reduction mode for isolating samples without sputtering
  • Broad range of accessories for highest flexibility (cooling stage, eucentric tilt and rotation stage, upgrade packages, integration in iMagic database etc.)

Phenom proX - High-resolution electron microscope with fully integrated EDX analysis

  • Magnification range 80 - 130.000 x
  • Sample loading time < 30 s
  • Resolution 14 nm on gold at 10 kV
  • EDX point measurements, mapping and line scans, fully automated reports
  • Element identification from Boron to Americium
  • Acceleration voltages 4.8 - 15 kV

Phenom Pro - High-resolution electron microscope

  • Magnification range 80 - 130.000 x
  • Sample loading time < 30 s
  • Resolution 14 nm on gold at 10 kV
  • Acceleration voltages 4.8 - 10 kV
  • Can be upgraded to Phenom proX

Phenom Pure and Pure+ - Entry-level systems at an affordable price

  • For applications where light microscopy reaches its limits
  • Magnification range 80 - 30.000 x (Pure+: 65.000 x)
  • Sample loading time: < 30 s
  • Resolution: <30 nm on gold at 5 kV (Pure+: < 25 nm on gold at 10 kV)
  • Can be upgraded to Phenom pro und proX

Phenom XL - Desktop electron microscope with large sample chamber

  • For the analysis of entire components or up to 36 pin stubs on SEM sample holders
  • Scan area up to 100 x 100 mm, depth 50 mm
  • Optional SE detector                                              
  • 20 kV for the quantitative EDX analysis of heavy samples

Particle Size Analyzer - Disc Centrifuge for small and very small particles


Ortsaufgelöste Spektroskopie in Pharmazie und Lebensmitteltechnik

LOGO_Ortsaufgelöste Spektroskopie  in Pharmazie und Lebensmitteltechnik

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